电路成品率的英文

• circuit yield

• 电路    circuit; electric circuit; e ...
• 成品率    finished product rate; rate of final products; recovery; the rate of finished products; yield
• 高成品率集成电路生产    high yield ic production
• 薄片成品率    per slice yield
• 成品率降低    yield reduction
• 成品率图    yield map
• 钢锭成品率    ingot yield; ingot-to-product yield
• 回收率，成品率    yield，yield rate
• 浇注成品率    casting yield
• 金属成品率    metal yield
• 晶片成品率    wafer yield
• 门成品率    gate yield
• 芯片成品率    chiyield; dice yield; die yield
• 总成品率    percentage of pass
• 组装成品率    assembly yield
• 低成品率薄片    low yielding wafer
• 路成    lu zheng
• 成品率递减因子    yield killer
• 探针测试成品率    probe yield
• 单位时间人均成品率    weight per person-hour
• 一次性通过的成品率    first pass yield
• 路成玉    lu chengyu
• 成品电路板，不动产    real estate
• 成品    complete product; completed product; end items; end product; final end-product; final endpoint; final goods; final product; finish product; finished board; finished goods; finished item; finished materials; finished products; finished stock; finishes; hardware; job; made-up articles; off-the shelf item; ready commodity; ready-made articles; turnoff; yield
• 网路成瘾症    internet addiction disorder

• This thesis aims at discussing the model of manufacturing defects , the principles of soft and hard faults induced by manufacturing defects , the effects of soft fault on circuit reliability and yield and the relationship between yield loss and reliability decrease caused by manufacturing defects . the author ' s main contributions are as following : reliability and yield are two significant factors to semiconductor manufacture . based on the principles of the manufacturability engineering , the thesis discusses the effects of the manufacturing defect on the functional yield , parametric yield and the reliability for ics , and abstracts geometric models from actual chips
  本文对集成电路制造缺陷模型、由制造缺陷导致的软、硬故障的作用机理、软故障对电路可靠性和成品率的影响以及由制造缺陷导致的电路成品率的损失和可靠性下降之间的关系进行了系统的研究，主要研究结果如下：可靠性和成品率是影响半导体生产的两个主要因素，本文首先从集成电路的可制造性工程理论出发，讨论了制造缺陷在影响集成电路功能成品率、参数成品率和可靠性方面的作用。