场发射扫描电子显微镜的英文

• field emi ion sca ing electron microscope

• 场    a level open space; threshin ...
• 发射    launch; radiate; project; di ...
• 扫描    scan; scanning; scansion; sw ...
• 尝射扫描电子显微镜    field emission scanning electron microscope
• 透射扫描电子显微镜    transmission scanning electron microscope; transmission scanning electron microscopy
• 场发射电子显微镜    field emission electron microscope
• 扫描电子显微镜    flying spot electron microscope; sca ing electron microscope; sca ing electronic microscope; sca ingelectronmicroscope; scaning electron microscopy; scanning electron microscope (sem); scanning electron microscope(sem); scanning electronic microscope; scanning microscope; scanningelectronmicroscope; sem scanning electron microscope; sem－eds = scanning electron microscope－energy dispersive spectrometry
• 扫描电子显微镜术    scanning electron microscopy; scanningelectronmicroscopysem
• 透射扫描电子显微术    transmission scanning electron microscopy; tsem
• 轻便型场发射枪扫描式电子显微镜    feg mini sem
• 传导式扫描电子显微镜    transmission scanning electron microscope
• 电视扫描电子显微镜    television scanning electron microscope
• 俄歇扫描电子显微镜    auger scanning microscope
• 高分辨率扫描电子显微镜    high resolution scanning electron microscope; hrsem
• 高性能扫描电子显微镜    high performance scanning electron microscope
• 离子枪式扫描电子显微镜    auger scanning electron microscope
• 免疫扫描电子显微镜    immuno-sem
• 普及型扫描电子显微镜    popular sca ing electron microscope,; popular scanning electron microscope; popular transmission electron microscope
• 扫描电子显微镜成像    scanning electron image
• 扫描电子显微镜的使用    use of scanning electron microscope
• 扫描电子显微镜的缩略语    sem scanning electron microscope
• 扫描电子显微镜检查法    scanning electron microscopy
• 扫描电子显微镜检技术    technique for scanning electron microscopy; techniques for scanning electron microscopy
• 扫描电子显微镜检术    scanning electron microscopy
• 扫描电子显微镜物镜    objective lens of the scanning electron microscope; objective lens of the transmission electron microscope

• Field emission scanning electron microscope
  场发射扫描电子显微镜
• The cenosphere particles were characterized with optical microscope , field emission scanning electron microscopy ( fesem ) , energy - dispersive spectroscopy ( eds ) and x - ray diffraction ( xrd ) in and after the plating
  用光学显微镜、场发射扫描电子显微镜、能谱仪和x射线衍射仪对其进行了分析表征。